See the New PXI Platform for reduced cost of semiconductor testing!        

NI Modules Expand PXI Platform Capability, Reduce Cost for Semiconductor Characterization and Test

National Instruments expands the capabilities of its PXI platform for semiconductor characterization and production test with new per-pin parametric measurement unit (PPMU) modules and source measure unit (SMU) modules. The NI PXIe-6556200 MHz high-speed digital I/O with PPMU, the NI PXIe-4140and NI PXIe-4141four-channel SMUs reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of devices under test.

With the NI PXIe-6556 high-speed digital I/O module, engineers can generate and acquire a digital waveform at up to 200 MHz or perform DC parametric measurements with one percent accuracy on the same pin, simplifying cabling, decreasing test times and increasing the density of the tester.

(Visit Stand C4 for demonstrations)